Notes about MVD electronics

Notes related to MCM testing:

  • MCM test procedure
  • MCM test form
  • summary of MCM testing
  • summary of performance changes in evaluation lot MCMs
  • timeline for MCM evalulation lot
  • locations on MCMs of AMU/ADC chips which failed
  • study of level-1 delay
  • suggested default values for serial string settings
  • summary of testpoints on MCMs
  • an (old) study of discriminator performance
  • a study of discriminator performance

    Notes related to PC/MCM testing:

  • Tests of the serial string bits
  • ADC clock enable width/serial string bits
  • Some key control signals for the ADCs
  • Scope traces of key output signals from AMU/ADC chips
  • Notes about setting up the ADC ramp
  • Misc notes about problems we had (now fixed) with the PC/MCM.
  • Signal-to-noise studies.

    Notes related to interface modules:

  • dcim testing
  • dcim test results htm, pdf, or msword.
  • Clock signals on the TCIM
  • Clock signals on DCIM(10-Aug-2000)
  • More on DCIM Clock signals (4-Oct-2000)
  • More on DCIM Clock signals (14-Nov-2000)
  • Clock signals on IM crate backplane (13-Nov-2000)

    other notes:

  • Connectors on MVD motherboard
  • Notes about the order serial string bits are sent
  • Notes about the MVD chaintest
  • MCM+Si QA with laser station
  • addressing of MCMs, DCIMs, DCMs, ... in year-2
  • addressing of MCMs, DCIMs, DCMs, ... in year-3
  • addressing of MCMs, DCIMs, DCMs, ... in year-4
  • Arcnet addressing in year-4
  • sensors we use
  • Program to manipulate serial string bits (arcnet files)
  • Testing assemblies with an LED
  • Notes about zero-suppression, etc
  • Links to Xilinx files
  • Copies of year-4 arcnet files for MVD
  • Misc schematics and layouts
  • Notes on connections to AIM's

    updated 19-Dec-03
    John Sullivan