MCM test form, June 28, 2000 version MCM serial number:
Date of test: Name of person who did test:

Power up and initial checkout of clock waveforms
Before connecting the MCM to the test setup, check the resistance between power and ground lines for apparent shorts (reject if any are less than 1K-ohm). Record these measurements in the 1st table below. Next, Connect MCM to the power supplies, turn on, and record the power supply currents in the 2nd table below. Measure the voltages in the following table.
voltage name pin number measured M-ohm to DGND (pin38) typical voltage measured voltage
Si bias 1 M-ohm +40V V
+5VA_TGV 4 M-ohm +4.84V V
+5VA_Comp 9 M-ohm +5.05V V
+5VA_AMU/ISUM 11 M-ohm +4.81V V
-5VA, ISUM 13 M-ohm -4.99V V
+2.5VA, Vmid 14 M-ohm +2.47V V
+5VD HM and ADC 27 or 29 M-ohm +4.92V V

power supply measured current
before download 		measured current
after download
+5VA A A
-5VA A A
+5VD A A

10MHz clock (pin 45) OK?
40MHz clock (pin 47) OK?
PECLA and PECLB clocks (pins 49,50). OK?

Download Xilinx, send the serial string
Does the digital current change from about 0.5 to 0.7 A when you download the MCM?
Send the serial string a 2nd time. Does serial data come out on pin 23?
Readback serial string. OK?

If the serial data looks OK, skip this step. If the serial readback fails or if the serial Data does not appear on the output lines, then fill in this table for the VFB_RES DAC TGV1 (= TP9).
When you are done, set Vfb to 3.03V. 		DAC setting
Volts 		measured at TP9
Volts
5.020 V V
3.508 V V
1.518 V V
0.006 V V

Check data packet format
Scope on 100 ns scale, put it in run mode, issue MCM reset, issue Level 1.
Are the clock and data out waveforms out of the MCM OK?
Does the test mode (ADCs=1,2,3,4...) work?
Check that the event number increases with each trigger. OK?
(First issue MCM reset) Are the AMU cell addresses are OK?
Is the the beam clock counter OK?
Horizontal and vertical parity OK?

Inject charge using Cal-enable mode and Bench-cal trigger
Make linearity plot, collect slopes and residuals (linearity.txt). OK?
Only if ADC problems are seen, check RAMP and CLK_ENABLE. OK?

Noise test
Disable all CAL_EN channels. Enable internal preamp resets (IREN=1). Send 250 bench-cal's. Plot pedestal width vs. channel. Save plot. Assume 66 ADC channels/mip.
What is typical signal/noise?
How many channels are worse than 6/1?
How many channels are worse than 10/1?

Check MUX's (spy channels)

Scope on 5 microsec/div scale, 20 MHz bandwidth.
Trigger off of Mode Bit 0 (pin 31) and look at preamp spy line (pin 16). Run
mux_test1.txt control file. Are the waveforms appearing on the scope?
Looking at preamp spy, disable a few channels with preamp disable bits. OK?
Scope on 20 microsec/div, 20 MHz bandwidth.
Trigger off of pin 16 and look at AMU spy (pin 18). Run mux_test1.txt again.
Waveforms OK?

Check the current sum discriminator
VCAL=3.48 for all chans, IREN=0, scope 20MHz BW, Use Bench Cal Enable, Integrator reset. Setup scope to trigger on preamp spy line (16) at charge injection (~600 mV), 100 ns scale.
CAL_EN all, 1/2, 1 channel and see ISUM change accordingly. OK?
Monitor the ISUM waveform at the MCM connector. OK?

Temperature sensor
Check temperature sensor output (p15). Should be around 600mV. Measured value:

Final recommendation: accept or reject?
Notes: