How Do We Mitigate Cost?
- Statistical Methods not available
- Reduce test time with clever vectors
- Eliminate Burn In
- Good Automated visual inspection
- Insightful stress testing at wafer probe
- Hugh Cost savings
Risk may be High
- Small savings by contracting through a university
- SNL may be able to help
Next: Chip Scale Packaging
Tony Moore (moore@icsun1.ic.ornl.gov
)