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Below you can see a schematic drawing of the beamtest prototype FEE boards. From left to right you can see:

1. The silicon strip detector. Only 32 out of 256 200-micron-pitch channels were wired up for the test. Small charge pulses are generated when particles traverse a channel. The silicon is connected by a 20 cm kapton cable to:
2. the TGV-4 preamp/integrator. This unit is an open integrator, such that the output jumps each time a signal is generated by the silicon. The integrator is reset every 1K (2K,4K,8K) beam clock cycles. The output voltage for every channel is sampled each beam clock and samples are stored in the:
3. the AMU, or analog memory units. When a LVL-1 trigger is received on the Heap Manager board on the right, the HM Field-Programmable Gate Array, who is the chief of this little domain, instructs the Address List Manager FPGA to calculate the addresses of the AMU cells where the appropriate voltage sample pairs are held. The AMUs then deliver the samples to the ADCs, and the HM collects all digitized information, and packages it up into two events: one corresponding to the instant just before the trigger event occurred, and the second event corresponding to a snapshot one beam cycle later.