Beam Test Data



  1. Pre-sample:
      ADC values before event
      Includes high & low freq noise


  2. Post-sample:
      ADC values after event
      Includes high & low freq noise


  3. Post-Pre:
      Subtract ped & low freq noise
      High freq noise remains


  4. subtraction:
      Removes high freq noise
      Remaining width due to ADC
      resolution